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Semiconductor inspection machine


Product use: Semiconductor IR hidden collapse inspection machine, which can penetrate silicon wafers (Silicon Wafer) for hidden collapse detection.

Application areas

  • Product Description
    • Commodity name: Semiconductor inspection machine
    • Commodity ID: DSI-2000

    Product use: Semiconductor IR hidden collapse inspection machine, which can penetrate silicon wafers (Silicon Wafer) for hidden collapse detection.

    As the manufacturing process of semiconductor (Semiconductor) becomes finer and finer, the wafer (Wafer) becomes thinner and thinner, and the quality challenge faced by wafer-level packaging is getting bigger and bigger. The patented IR collapse detector can penetrate silicon wafer (Silicon Wafer) to help customers confirm whether IC has the problems of back collapse, crack and collapse, and can be equipped with full-automatic loading and unloading system and automatic judgment software, effective quality control.

Product Consulting

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